- M. S. Benilov,
M. D. Cunha, W. Hartmann, S. Kosse, N. Wenzel, and A. Lawall, Modeling spots on
copper and copper-chromium cathodes of vacuum arcs, Abstracts PPPS 2013 IEEE
PPPS 2013 (the combined 19th IEEE Pulsed Power Conference and 40th IEEE
International Conference on Plasma Science) (June 16-21, 2013, San Francisco,
USA).
- N. A. Almeida, M. S. Benilov, L. G. Benilova, W.
Hartmann, and N. Wenzel, Modeling near-cathode plasma layer on contacts of
vacuum arcs, Abstracts PPPS 2013 IEEE PPPS 2013 (the combined 19th IEEE Pulsed
Power Conference and 40th IEEE International Conference on Plasma Science) (June
16-21, 2013, San Francisco, USA).
- P. G. C. Almeida, M. S. Benilov, M. D. Cunha, J. G. L.
Gomes, Computing DC glow and arc discharges by means of COMSOL Multiphysics:
time-dependent vs. stationary solvers, Abstracts PPPS 2013 IEEE PPPS 2013 (the
combined 19th IEEE Pulsed Power Conference and 40th IEEE International
Conference on Plasma Science) (June 16-21, 2013, San Francisco, USA).
- M. S. Benilov and L. G. Benilova, Field to thermo-field
to thermionic electron emission: a practical guide to evaluation, effect on arc
cathodes, Proc. XXXI ICPIG (Granada, Spain, July 14 – 19, 2013).
- M. S. Benilov and M. D. Cunha, Simulating plasma-cathode
interaction in high-pressure arc discharges by means of time-dependent and
stationary solvers of COMSOL Multiphysics, Proc. XXXI ICPIG (Granada, Spain,
July 14 – 19, 2013).
- P. G. C. Almeida, M. S. Benilov, D. F. Santos, W. Zhu,
P. Niraula, Self-organization in DC glow microdischarges in krypton: 3D
modelling and experiments, Proc. XXXI ICPIG (Granada, Spain, July 14 – 19,
2013).
- N. A. Almeida and M. S. Benilov, Simulating AC current transfer
through near-electrode layers in very-high pressure arcs by means of COMSOL Multiphysics,
Proc. XXXI ICPIG (Granada, Spain, July 14 – 19, 2013).
- W. Zhu, P. G. C.
Almeida, M. S. Benilov, D. F. Santos, and P. Niraula, Self-organized patterns of
spots in DC glow microdischarges in krypton, Bull. Amer. Phys. Soc., Proc. 66th
Gaseous Electronics Conf., vol. 58, No. 8, p. 83, 2013.